STEM EDX_HR_spectrum.xlsx
app/temp/uploads/STEM-EDX/9e3b579b-783e-46e8-93af-247f59c70f0f/STEM EDX_HR_spectrum.xlsx
Summary
**Summary:** This file contains a high-resolution Energy Dispersive X-ray Spectroscopy (EDS/EDX) spectrum acquired using a Bruker Nano detector on a Scanning Transmission Electron Microscope (STEM). The dataset captures X-ray emission data across 4,096 energy channels (0–~40 keV) with associated count rates (CPS), collected on May 5, 2022. **Context & Parameters:** - **Technique:** STEM-EDX (200 keV primary electron energy), likely for elemental mapping or point analysis of catalyst materials at nanoscale resolution - **Acquisition:** ~250 s real time / ~206 s live time; detector positioned at 22° take-off angle, 45° azimuth - **Detector:** Custom solid-state detector (likely SDD), 0.45 mm thickness, windowless configuration, energy resolution ~129 eV (Mn Kα), calibrated at ~10 eV/channel - **Data:** Spectrum spanning channels 0–4095 with corresponding energy values (offset: -951.4 eV) and count data, suitable for quantitative elemental identification of the sampled catalyst region
Chunks
5 chunks available
Date: ,05.05.2022,, ,,, Primary energy: ,,200,keV Tilt angle: ,,0,° Take off angle: ,,22,° Azimut angle: ,,45,° Real time: ,,250215,ms Life time: ,,205739,ms Detector type: ,,Custom type, Si dead layer:,,0,µm Detector thickness: ,,0.45,mm Window type: ,,no window, Fano factor: ,,0.110000000004569, Mn FWHM: ,,129.395906409902,eV "Calibration, lin.: ",,9.992,eV "Calibration, abs.: ",,-951.43824,eV
,,, Esprit,,,
Channels: ,,4096, ,,, ,,, Channel,Energy,Counts,CPS 0,-0.95143824,0,0 4095,39.96580176,10.00882,0.0400008792438503
,,, Spectrum: ,1,,
Sheet1/1: Spectrum "Bruker Nano GmbH Berlin, Germany",Unnamed: 1,Unnamed: 2,12.05.2022